[1]郭俊杰,许并社.球差矫正电子显微镜在新型二维晶体材料研究中的应用[J].中国材料进展,2015,(5):006-10.[doi:10.7502/j.issn.1674-3962.2015.05.04]
　GUO Junjie,XU Bingshe.Application of aberration-corrected electron microscope on the study of novel two-dimensional crystals[J].MATERIALS CHINA,2015,(5):006-10.[doi:10.7502/j.issn.1674-3962.2015.05.04]
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球差矫正电子显微镜在新型二维晶体材料研究中的应用()
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中国材料进展[ISSN:1674-3962/CN:61-1473/TG]

卷:
期数:
2015年第5期
页码:
006-10
栏目:
特约研究论文
出版日期:
2015-05-31

文章信息/Info

Title:
Application of aberration-corrected electron microscope on the study of novel two-dimensional crystals
作者:
郭俊杰 ; 许并社
太原理工大学 新材料界面科学与工程教育部重点实验室
Author(s):
GUO Junjie;  XU Bingshe
Key Laboratory of Interface Science and Engineering in Advanced Materials of Ministry of Education，Taiyuan University of Technology
关键词:
扫描透射电子显微镜; 电子能量损失谱; 石墨烯; 二维晶体
DOI:
10.7502/j.issn.1674-3962.2015.05.04
文献标志码:
A
摘要:
近年来，二维晶体材料由于其独特的微观结构和新颖的物理化学性能得到了诸多领域研究者的广泛关注。本文简要介绍了球差矫正电子显微学在新型二维晶体材料研究中的最新进展。装备有球差矫正器的新型电子显微镜在低加速电压下（60kV）的分辨率可以达到~0.1nm，避免了对B, C, N 和O等轻元素原子的knock-on 损伤。通过原子分辨率的电子能量损失谱分析验证了原子序数衬度成像在二维晶体观测中的可靠性。利用球差矫正电子显微成像技术在二维晶体中快速准确判断掺杂原子的种类，可以研究二维晶体材料中原子尺度的界面和缺陷结构，这一进展将对晶体结构学、材料科学、物理学等产生重大影响。
Abstract:
In recent years, two-dimensional crystals have sparked high scientific interest in various research fields due to their special microstructures and novel physical and chemical properties. Here, we introduce the recent developments in 2D crystals studied by the aberration corrected scanning transmission electron microscope (STEM). The latest STEM equipped a new aberration corrector has made it possible to reach probe sizes close to 0.1 nm at 60 keV, an operating energy that avoids direct knock-on damage in materials consisting of light atoms such as B, C, N and O. The strong Z dependence of annular dark field (ADF) imaging on 2D crystals, convinced by atomic resolution electron energy loss spectroscopy (EELS) analysis, allows the chemical identification of individual atoms. The ability of explore the atomic resolution interface and defect structure in 2D crystals can make contribution to the crystallography, materials science, and physics.
更新日期/Last Update: 2015-04-29