Abstract

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Title:: Application of Synchrotron Radiation Absorption Spectroscopy in Energy Storage Mechanism Research of NiCo2O4 Electrode Materials

Author(s):: QI Ying; HU Xiaoyu; WAN Chubin; 1. Laboratory Service Guarantee Center Beijing，Beijing 101100 2. School of Materials Science and Engineering, Zhejiang University，Hangzhou 310027 3. Department of Physics, University of Science and Technology Beijing，Beijing 100083

Keywords:: electrode materials; NiCo2O4; synchrotron radiation; microstructure; XAFS

Abstract:: X-ray absorption fine structure (XAFS) is a powerful analytical technique based on synchrotron radiation sources, used to study the local atomic or electronic structure of materials. The XAFS technique finds wide applications in physics, materials science, chemistry, environmental science, and other fields. This article summarizes the recent applications of XAFS technique in the research of electrode materials for supercapacitors, focusing on NiCo2O4 electrode materials. The main contents include: (1) the application of XANES in determining the oxidation state of elements and charge transfer, (2) the application of EXAFS in determining atomic coordination structures, (3) the application of in-situ XAFS in determining the electrochemical reaction mechanism. It is hoped that this review will help researchers gain a deeper understanding for the electrochemical energy storage mechanism of this material from a microstructural perspective, and promote the development of NiCo2O4 electrode materials and capacitors.