2013 12
Applications of Focused Ion Beam in the Study on Mechanical Properties of Micro/nanomaterials
TIAN Lin,FU Qin,SHAN Z
2013 12 [706-715][Abstract](7467)[pdf 2160KB](4465)
 Focused Ion Beam (FIB) and its Applications
Han Wei , Xiao Siqun
2013 12 [716-727][Abstract](7657)[pdf 3841KB](4738)
Applications of FIB/SEM DualBeam system for Micro-Nanofabrication and characterization
PENG Kaiwu
2013 12 [728-734][Abstract](7410)[pdf 3020KB](4086)
 FIB three-dimensional characterization analysis techniques and its application progress
 JIA Zhihong, WANG Xueli, XING Yuan, LIU Yingying, LIU Qing
2013 12 [735-741][Abstract](6275)[pdf 1219KB](3955)
 The fabrication and testing of 3D metal passive inductor based on FIB-SID technology
 Y.F.Mao1, Z.Q.Wang1,2, L.R.Zhao1, W.G.Wu1, J.Xu3
2013 12 [742-745][Abstract](5814)[pdf 1331KB](3639)
 Research Progress of Diamond Cutting Tools’ Development based on Focused Ion Beam (FIB)
 Zongwei Xu, Wei Wu, Shaojing Zhang
2013 12 [746-750][Abstract](4870)[pdf 1345KB](3536)

Research Progress of Additive Elements on the Properties of AZO Thin Films


LI Chunguang1,3, WANG Fei1,3,*, AN Tao1,WANG Dongxin2


2013 12 [752-759][Abstract](3984)[pdf 1061KB](3392)