[1]王 宇,李 炯,张 硕,等.X射线吸收精细结构在材料科学中的应用[J].中国材料进展,2017,(3):021-25.[doi:10.7502/j.issn.1674-3962.2017.03.05]
 WANG Yu,LI Jiong,ZHANG Shuo,et al.Applications of X-ray absorption fine structure in materials science[J].MATERIALS CHINA,2017,(3):021-25.[doi:10.7502/j.issn.1674-3962.2017.03.05]
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X射线吸收精细结构在材料科学中的应用()
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中国材料进展[ISSN:1674-3962/CN:61-1473/TG]

卷:
期数:
2017年第3期
页码:
021-25
栏目:
前沿综述
出版日期:
2017-03-31

文章信息/Info

Title:
Applications of X-ray absorption fine structure in materials science
作者:
王  宇 李  炯 张  硕 马静远 汪丽华 魏向军 黄宇营 姜  政
中国科学院上海应用物理研究所上海光源
Author(s):
WANG Yu LI Jiong ZHANG Shuo MA Jinyuan WANG Lihua WEI Xiangjun HUANG Yuying JIANG Zheng
Shanghai Institute of Applied of Physics, Chinese Academy of Sciences
关键词:
材料科学同步辐射XAFS 时间分辨的XAFS原位XAFS
Keywords:
materials science synchrotron radiation XAFS Time-resolved XAFS in situ XAFS
DOI:
10.7502/j.issn.1674-3962.2017.03.05
文献标志码:
A
摘要:
X射线吸收精细结构(XAFS)方法是随着同步辐射发展起来的独特技术,是研究材料局域原子结构和电子结构的一种重要方法。相比于X射线衍射,XAFS仅仅对于吸收原子周围局域结构敏感,样品可以使固体、液体甚至是气体。本文概述了XAFS的基本原理及几种常用的实验方法,结合上海光源的XAFS线站成果,介绍了近年来不同XAFS方法在催化、能源、纳米和半导体等材料科学热门研究领域的最新研究进展,展示了目前XAFS方法在材料科学研究中所发挥的重要作用,最后根据国内同步辐射光源和相关XAFS研究方法进一步发展,展望了XAFS技术在材料科学研究中应用前景。
Abstract:
X-ray absorption fine structure (XAFS) is a very powerful technique to investigate the local electronic and geometrical structure around the photoabsorber with the development of synchrotron radiation. In particular, its unique sensitivity to the local structure, as compared to x-ray diffraction (XRD) have been exploited for studying the gas, solution, or condensed matter. In this review, we report the principle and experimental method of XAFS and highlight recent applications on catalytic materials, energy materials, semiconductor materials and other hot fields of science research to help potential users in locating the spectrometer required for their materials science application. Finally, possible applications of XAFS are discussed according to the developing trend for XAFS method.
更新日期/Last Update: 2017-02-28