Key Laboratory of Interface Science and Engineering in Advanced Materials of Ministry of Education，Taiyuan University of Technology
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DOI:
10.7502/j.issn.1674-3962.2015.05.04
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Abstract:
In recent years, two-dimensional crystals have sparked high scientific interest in various research fields due to their special microstructures and novel physical and chemical properties. Here, we introduce the recent developments in 2D crystals studied by the aberration corrected scanning transmission electron microscope (STEM). The latest STEM equipped a new aberration corrector has made it possible to reach probe sizes close to 0.1 nm at 60 keV, an operating energy that avoids direct knock-on damage in materials consisting of light atoms such as B, C, N and O. The strong Z dependence of annular dark field (ADF) imaging on 2D crystals, convinced by atomic resolution electron energy loss spectroscopy (EELS) analysis, allows the chemical identification of individual atoms. The ability of explore the atomic resolution interface and defect structure in 2D crystals can make contribution to the crystallography, materials science, and physics.