[1]杨春明,洪春霞,周平,等.同步辐射小角X射线散射及其在材料研究中的应用[J].中国材料进展,2021,40(02):112-119.[doi:10.7502/j.issn.1674-3962.202009018]
 YANG Chunming,HONG Chunxia,ZHOU Ping,et al.Synchrotron Radiation Small Angle X-ray Scattering in Materials Research[J].MATERIALS CHINA,2021,40(02):112-119.[doi:10.7502/j.issn.1674-3962.202009018]
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同步辐射小角X射线散射及其在材料研究中的应用()
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中国材料进展[ISSN:1674-3962/CN:61-1473/TG]

卷:
40
期数:
2021年第02期
页码:
112-119
栏目:
出版日期:
2021-02-28

文章信息/Info

Title:
Synchrotron Radiation Small Angle X-ray Scattering in Materials Research
文章编号:
16743962(2021)02011208
作者:
杨春明123洪春霞12周平12缪夏然12李小芸12李秀宏123边风刚123
(1中国科学院上海高等研究院 上海光源,上海201204)(2中国科学院上海应用物理研究所,上海201800)(3中国科学院大学,北京100049)
Author(s):
YANG Chunming123 HONG Chunxia12 ZHOU Ping12 MIAO Xiaran12 LI Xiaoyun12 LI Xiuhong123 BIAN Fenggang123
(1Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China) (2Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China) (3University of Chinese Academy of Sciences, Beijing 100049,China)
关键词:
小角X射线散射同步辐射掠入射X射线散射广角X射线散射原位SAXS反常小角X射线散射
Keywords:
small angle X-ray scattering synchrotron radiation grazing incidence small angle X-ray scattering wide angle X-ray scattering in-situ SAXS anomalous smallangle X-ray scattering
分类号:
O57
DOI:
10.7502/j.issn.1674-3962.202009018
文献标志码:
A
摘要:
小角X射线散射(small angle X-ray scattering, SAXS)是研究物质内部一纳米到数百纳米甚至到微米尺度级别微观结构的有力工具。近年来随着我国同步辐射技术的不断发展,同步辐射SAXS技术被越来越多地应用到各种材料的研究领域。然而,由于SAXS图谱是倒空间的信号,并不像显微镜那么直观,也不如X射线衍射(XRD)那么被大家所熟知。简要介绍了SAXS的基本原理(稀疏体系、稠密体系),简短回顾了我国同步辐射小角散射线站的发展和进步。主要介绍了最近十余年基于同步辐射SAXS原位实时检测技术在高分子材料成型加工(结晶、取向性、周期性),原位SAXS和反常SAXS技术在合金相析出(成分、团簇尺寸),以及掠入射X射线散射在介孔薄膜(区域尺寸、位错因子)和有机光伏薄膜等领域中的典型应用,并展望了同步辐射SAXS技术的发展趋势及其在材料领域的应用前景。
Abstract:
Small angle X-ray scattering (SAXS) is a powerful tool for the studying of the microscopic structure of materials from 1 nm to hundreds of nm and even micron scale. With the development of synchrotron radiation technology in China, synchrotron radiation SAXS has been more and more applied to the research in various fields of materials. However, since SAXS is observed in a reciprocal space, it is not as intuitive as a microscope and is not as well known as X-ray diffraction (XRD). In this paper, the basic principles of SAXS (sparse system, dense system) are introduced, and the development and progress of synchrotron radiation SAXS beamline in China are also briefly reviewed. The typical applications of in-situ SAXS techniques are introduced, for example, in-situ real-time SAXS in polymer materials processing (crystallization, orientation, periodicity, etc.), in-situ and abnormal SAXS applications in the phase precipitation of the alloy (precipitation chemical composition, clusters size, etc.), and grazing incidence X-ray scattering in the mesoporous thin films (domain size, dislocation factor, etc.) as well as organic photovoltaic film, etc. Finally, the development trends of synchrotron radiation SAXS technology and its application prospect in materials research are also discussed.

备注/Memo

备注/Memo:
收稿日期:20200916 修回日期:20210126 基金项目:国家自然科学基金资助项目(U1932118,U1732123);科技部重点研发计划项目(2018YFB0704200,2017YFA0403000)第一作者:杨春明,男,1981年生,副研究员,硕士生导师, Email:yangchunming@zjlab.org.cn 通讯作者:边风刚,男,1977年生,研究员,博士生导师, Email:bianfenggang@zjlab.org.cn
更新日期/Last Update: 2021-02-01